New space

Rad-tolerant memory and power solutions for Low Earth Orbit (LEO) space electronics designs

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About

Ideal for Low Earth Orbit (LEO) applications and constellations, Infineon’s radiation-tolerant memories and power solutions enable a right-sized mix of performance and reliability based on size, weight, power, and cost (SWaP-c) considerations.

Infineon’s decades of experience in both automotive and space electronics results in a portfolio that is rad-tolerant by design for the vital support functions of LEO satellite bus platform and payload operations.

Choosing electronics components that are inherently radiation tolerant is an important consideration for Low Earth Orbit (LEO) space and satellite designs. Rad hard components are specifically designed to withstand radiation effects but can be more expensive. Rad-tolerant components are less robust but can still operate in LEO environments with some level of radiation mitigation techniques. Careful components selection with appropriate radiation tolerance levels is key for system reliability.

Working with IR HiRel provides access to Infineon’s broad portfolio of power semiconductor solutions which can be up-screened according to customer requirements such as: 

  • 100% burn-in testing to detect early "infant mortalities" failure 
  • Wearout
  • 100% wafer-level probe
  • Extended operating temperature qualification, including over MIL temperature range -55°C to 125°C
  • Assembly of up-screened silicon in plastic packages

Through IR HiRel, extension of product life or support services (such as die and wafer bank) are also available for Infineon COTS and automotive power components that may be used in high-reliability electronic designs in space, avionics, defense, medical, and more. This ensures supply longevity, avoiding obsolescence-induced support issues and requalification costs, which can be significant in high-reliability applications.

Ideal for Low Earth Orbit (LEO) applications and constellations, Infineon’s radiation-tolerant memories and power solutions enable a right-sized mix of performance and reliability based on size, weight, power, and cost (SWaP-c) considerations.

Infineon’s decades of experience in both automotive and space electronics results in a portfolio that is rad-tolerant by design for the vital support functions of LEO satellite bus platform and payload operations.

Choosing electronics components that are inherently radiation tolerant is an important consideration for Low Earth Orbit (LEO) space and satellite designs. Rad hard components are specifically designed to withstand radiation effects but can be more expensive. Rad-tolerant components are less robust but can still operate in LEO environments with some level of radiation mitigation techniques. Careful components selection with appropriate radiation tolerance levels is key for system reliability.

Working with IR HiRel provides access to Infineon’s broad portfolio of power semiconductor solutions which can be up-screened according to customer requirements such as: 

  • 100% burn-in testing to detect early "infant mortalities" failure 
  • Wearout
  • 100% wafer-level probe
  • Extended operating temperature qualification, including over MIL temperature range -55°C to 125°C
  • Assembly of up-screened silicon in plastic packages

Through IR HiRel, extension of product life or support services (such as die and wafer bank) are also available for Infineon COTS and automotive power components that may be used in high-reliability electronic designs in space, avionics, defense, medical, and more. This ensures supply longevity, avoiding obsolescence-induced support issues and requalification costs, which can be significant in high-reliability applications.

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